On-component multilayer tri-axial capacitive probe for clearance measurement

Tommaso Addabbo, Francesco Bertocci, Ada Fort, Marco Mugnaini, Valerio Vignoli, Chiara Cinelli
Abstract:
In this paper, an on-component triaxial capacitive probe for clearance measurement (static and dynamic measurement of distance) is proposed and studied. The device is designed to be deposited onto machinery components or complex structures and is aimed at reducing the impact of probe mounting on the monitored component. The problem is discussed from a theoretical point a view and then supported by the development of a prototype in screen printed technology. The results prove the feasibility of this innovative device.
Download:
IMEKO-TC10-2017-025.pdf
DOI:
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Event details
IMEKO TC:
TC10
Event name:
TC10 Workshop on Technical Diagnostics 2017
Title:

15th IMEKO TC10 Workshop "Technical Diagnostics in Cyber-Physical Era"

Place:
Budapest, HUNGARY
Time:
06 June 2017 - 07 June 2017