Degradation rate of eight photovoltaic plants: results during six years of continuous monitoring |
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| A. Carullo, A. Castellana, A. Vallan, A. Ciocia, F. Spertino |
- Abstract:
- The results of six years of continuous monitoring are presented in this paper that refer to eight outdoors PhotoVoltaic (PV) plants. The monitored plants are based on different technologies: mono-crystalline silicon (m-Si), poli-crystalline silicon (p-Si), string ribbon silicon, Copper Indium Gallium Selenide (CIGS) thin film and Cadmium Telluride (CdTe) thin film. Mono-crystalline silicon modules and thin-film modules are used both in fixed installation and on x-y tracking systems. The results are expressed in terms of degradation rate of the efficiency of each PV plant, which is estimated from the measurements provided by a multi-channel dataacquisition system that senses both electrical and environmental quantities. A comparison with the electrical characterization of each plant obtained by means of the transient charge of a capacitive load is also proposed. The capacitive-load technique has been implemented immediately after the installation of the PV plants and after 78 months of operation. The obtained results show that both the m-Si plants in fixed installation and on the tracking system had a negligible degradation, while p-Si and string-ribbon Si exhibited a moderate degradation. Higher was the degradation obtained for the thin-film based plants, with a worst behaviour of the plants installed on the tracking systems.
- Keywords:
- photovoltaic power systems, degradation, electric variables measurement, data acquisition
- Download:
- IMEKO-TC4-2017-052.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2017
- Title:
22nd IMEKO TC4 Symposium and 20th International Workshop on ADC Modelling and Testing
"Supporting world development through electric&electronic measurements"- Place:
- Iasi, ROMANIA
- Time:
- 14 September 2017 - 15 September 2017