UNCERTAINTY ESTIMATION OF LATTICE PARAMETERS MEASURED BY X-RAY DIFFRACTION |
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| Marcos F. de Campos, Jailton C. Damasceno, Rogério Machado, Carlos A. Achete |
- Abstract:
- Abstract: The uncertainties in lattice parameters determination, for X-Ray Diffractometers with Bragg- Brentano geometry, were estimated according GUM recommendations using the Monte Carlo simulation approach. The analyzed specimen was a Corundum NIST 1976 SRM Standard. Misalignment of instrument (zero 2theta offset and peak position) is an important error source, and should be kept (2θ) < 0.015° to be able to perform lattice parameters measurements with an accuracy = 0.0001 Angstrons. Sample displacement is in general the main source of error, and the above mentioned misalignment of instrument (0.015°) only becomes dominant as error source if the sample displacement is very small (<10 µm). The analysis showed that sample absorption (Corundum) is negligible as error source, if compared with sample displacement and equipment misalignment. Other possible sources of systematic error are discussed.
- Keywords:
- lattice parameters, X-Ray diffraction, error estimative, GUM, diffractometers
- Download:
- PWC-2006-TC8-008u.pdf
- DOI:
- -
- Event details
- Event name:
- XVIII IMEKO World Congress
- Title:
Metrology for a Sustainable Development
- Place:
- Rio de Janeiro, BRAZIL
- Time:
- 17 September 2006 - 22 September 2006