SI, BIPM, RMOs, NMIs. WHAT NEXT?

António Cruz, Eduarda Filipe
Abstract:
The organizations responsible for the maintenance of the measuring standards according the SI at international, regional and national levels are facing new challenges. A worldwide efficient and transparent metrology requires a new model of organization. The authors give an overview of the actual challenges and explain their thinking about where to go and how to built up it in the future.
Keywords:
SI, BIPM, metrology
Download:
PWC-2006-TC8-015u.pdf
DOI:
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Event details
Event name:
XVIII IMEKO World Congress
Title:

Metrology for a Sustainable Development

Place:
Rio de Janeiro, BRAZIL
Time:
17 September 2006 - 22 September 2006