IMPLEMENTATION OF THE BOARD-LEVEL OSCILLATION BUILD-IN SELF-TEST SCHEME FOR ANALOG CIRCUITS |
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| Wojciech Toczek, Marek Niedostatkiewicz |
- Abstract:
- The paper validates oscillation built-in selftest (OBIST) scheme for testing and measuring analog circuits assembled on a printed circuit board. This scheme uses both frequency, and time domain measurements in order to maximize the fault coverage. An implementation of the OBIST that comprises designing of oscillation-test structure and a measuring system based on microcontroller is presented. Special attention is being paid to the design of oscillatory circuit in such a way that leads to the orthogonal diagnostic process.
- Keywords:
- self-testing, oscillation-test method
- Download:
- IMEKO-TC4-2002-191.pdf
- DOI:
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