SEGMENTATION ALGORITHMS FOR INDUSTRIAL IMAGE QUANTITATIVE ANALYSIS SYSTEMS
Krzysztof Strzecha, Anna Fabijańska
Abstract:
In this paper computerized system for high temperature measurements of superficial properties has been presented. The process of superficial properties determination is based on digital image processing and analysis algorithms. Particular attention has been paid to adaptive thresholding algorithm with a local iterative threshold selection. Algorithm was elaborated to segment images obtained from the measurement process. Moreover, results of proposed algorithm have been presented. In the final stage of the paper difficulties appearing during high temperature measurements have been outlined. The authors have proposed methods of results correctness verification applying essential laws of the optics to a CCD camera lens.
Keywords:
image segmentation, thresholding, image quantitative analysis system, surface properties, high temperature measurements
Download:
PWC-2006-TC12-020u.pdf
DOI:
-
Event details
Event name:
XVIII IMEKO World Congress
Title:

Metrology for a Sustainable Development

Place:
Rio de Janeiro, BRAZIL
Time:
17 September 2006 - 22 September 2006
 Back