Design of High-speed ATE Calibration Equipment |
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| Yong Hu, Qiangmin Xia, Ying Xiao |
- Abstract:
- The calibration of Automated Test Equipment(ATE) is an important part of microelectronics measurement. To achieve full calibration of high-speed ATE, each high-speed digital channel should be traced to the calibration equipment. Calibrating each channel individually with an instrument will pose a great challenge to the calibration of ATE, and channel switching will increase a large amount of calibration time. This paper puts forward a design solution of calibration equipment of high-speed ATE, which can realize the versatility and portability of calibration equipment, and realize multichannel automatic calibration progress.
- Download:
- IMEKO-TC4-2020-40.pdf
- DOI:
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