IMPLEMENTING AN M-LAYER DATA MODEL

Mark Kuster
Abstract:
Recent work has proposed a metrologyinformation layer (M-Layer) to support digital systems with quantities and units by addressing the difficulties conventional quantity-unit systems pose for digitalization. This paper reports work toward developing the M-Layer’s current abstract conceptualization into a concrete model, working prototype, and demonstration software, with the eventual goal to create a FAIR (findable, accessible, interoperable, reusable) resource.
Keywords:
M-Layer, aspects, quantities, measurement units, measurement information infrastructure, digital metrology
Download:
IMEKO-TC6-2022-018.pdf
DOI:
10.21014/tc6-2022.018
Event details
Event name:
M4Dconf2022
Title:

First International IMEKO TC6 Conference on Metrology and Digital Transformation

Place:
Berlin, GERMANY
Time:
19 September 2022 - 21 September 2022
Event details
Event name:
Special session at M4Dconf2022
Title:

First International IMEKO TC6 Conference on Metrology and Digital Transformation

Place:
Berlin, GERMANY
Time:
19 September 2022 - 21 September 2022
Event details
Event name:
M4Dconf2022 (2)
Title:

First International IMEKO TC6 Conference on Metrology and Digital Transformation

Place:
Berlin, GERMANY
Time:
19 September 2022 - 21 September 2022