OUT OF MACHINE CALIBRATION TECHNIQUE FOR ANALOG PROBES

J.J. Aguilar, J.A. Yagüe, J.A. Albajez, J. Velázquez
Abstract:
A technique for the out of machine calibration of analog probes for CMM is presented in this paper. The process and the results obtained in different tests carried out on two different probes are shown. This calibration procedure allows to find out the measuring errors of these systems in a quick and reliable way.
Keywords:
analog probe, calibration, coordinate measuring machine
Download:
PWC-2006-TC14-021u.pdf
DOI:
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Event details
Event name:
XVIII IMEKO World Congress
Title:

Metrology for a Sustainable Development

Place:
Rio de Janeiro, BRAZIL
Time:
17 September 2006 - 22 September 2006