UNCERTAINTIES OF MULTI SENSORS CMM MEASUREMENTS APPLIED TO HIGH QUALITY SURFACES
Jean Marc Linares, Jean Mailhé, Jean Michel Sprauel
Abstract:
A statistical approach, based on a maximum likelihood criterion, is used to define the uncertainties of the derived element associated to a set of measured coordinates. The method is applied to high quality surfaces of low extent.
Keywords:
Uncertainties, Measurement
Download:
PWC-2006-TC21-024u.pdf
DOI:
-
Event details
Event name:
XVIII IMEKO World Congress
Title:

Metrology for a Sustainable Development

Place:
Rio de Janeiro, BRAZIL
Time:
17 September 2006 - 22 September 2006
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