Skip to main content

Proceedings

9762 papers found

J. Song, S. Low, L. Ma

FORM ERROR AND HARDNESS PERFORMANCE OF ROCKWELL DIAMOND INDENTERS

The influences of form errors on hardness performance of Rockwell diamond indenter are discussed. Experimental results are introduced. The Finite Element Analysis (FEA) method is used to simulate the hardness measurement process. The effect of tip radii and cone angles on hardness performance is obtained from our FEA model. It is suggested that FEA could be used to establish a relationship between the microform geometry and the hardness performance of Rockwell indenters, and to predict offsets in hardness readings based on the geometry parameters of the indenter, the testing cycle and the...

XVI IMEKO World Congress · TC5 · 2000 · Download
Z. Rymuza, M. Misiak, J. T. Wyrobek

CONSIDERATIONS ON NANOHARDNESS MEASUREMENT

Measurement of hardness on nano-scale is discussed. Methods and instruments used are described and energy definition of hardness is introduced. Results of nanohardness measurements of materials, in particular ultrathin films,used in Micro Electro Mechanical Systems (MEMS) technology are presented.

XVI IMEKO World Congress · TC5 · 2000 · Download
S. R. Low, D. J. Pitchure, C. D. Flanigan

THE EFFECT OF SUGGESTED CHANGES TO THE ROCKWELL HARDNESS TEST METHOD

In the latest revision of the ISO Rockwell hardness test standard (ISO/FDIS 6508(E), 1999), the introductory paragraphs introduce changes to the test practice; one new to this revision, and one suggested as a possibility for the next revision. The change to the new revision is the addition of allowing the use of hardmetal or tungsten-carbide balls for all Rockwell scales that use ball indenters. The change suggested for the next revision is to redefine the standard test forces presently based on rounded kilogram-force values, to converted and rounded Newton values. Since the development of...

XVI IMEKO World Congress · TC5 · 2000 · Download
K. Herrmann, K. Hasche, F. Pohlenz, R. Seemann

DEVELOPMENT OF CALIBRATION METHODS FOR THE NANOINDENTATION TEST

The nanoindentation method increasingly gains in importance for the determination of the mechanical properties of thin layers. Comparisons carried out in the field of the nanoindentation method reveal, however, significant deficits in calibration. The paper presents investigation results for the calibration of the essential quantities influencing the uncertainty of measurement. They chiefly comprise the geometrical deviations of the indenter, the depth and the force measuring system, the measuring deviation of zero point of the depth measurement and the compliance of the measuring device.

XVI IMEKO World Congress · TC5 · 2000 · Download
K. Herrmann, A.Stibler, P. Strobel

EFFECTS OF SOME INFLUENCE PARAMETERS ON THE CALIBRATION METHOD FOR IRHD ELASTOMER HARDNESS TESTERS

The method for hardness measurement expressed in International Rubber Hardness Degree - IRHD - of rubber and plastics is described in the standard ISO 48. Rising requirements to the accuracy of hardness measurements have led to the result that verification/calibration methods for the testers acknowledged by a standard are needed. Results of these investigations will be used as a basis for the establishment of the relevant international standard which is in preparation. Some experiments for IRHD measurement by "Low-hardness test" - method L and "Microtest" - method M are presented in this...

XVI IMEKO World Congress · TC5 · 2000 · Download
R. Affri, S. Desogus, A. Germak, F. Mazzoleni, D. Perteghella

OPTICAL MEASURING SYSTEM FOR HARDNESS INDENTERS

The described measuring system is a new system design in IMGC and developed in cooperation with AFFRI. It can be used to measure the geometrical characteristics of the Rockwell and Vickers diamond indenters. It is based on the interferometric image analysis of different sections of the indenters. Special algorithms are implemented to obtain, from a section of the interferometric images, the indenter profile reconstruction. The main characteristics of the measuring system are an adequate uncertainty to calibrate the indenters for the calibration of hardness testing machines and calibration of...

XVI IMEKO World Congress · TC5 · 2000 · Download
W. Winiecki, P. Bobinski, R. Lukaszewski

VISA DRIVERS IN DISTRIBUTED MEASUREMENT SYSTEMS

Application of software drivers, based on VISA architecture, in Java application and applets is considered. Next, an example of the system, that uses a communication based on sockets for remote controlling HP859x Spectrum Analyser, also via Internet, is presented.

XVI IMEKO World Congress · TC4 · 2000 · Download
M. Vrazic, I. Gasparac, Z. Simunic

EXPERIENCES IN BRIDGE TESTING WITH PROFIBUS-DP NETWORK

This paper shows our experiences in implementation of PROFIBUS-DP based industrial communication network in large structure (bridge) testing. Measurement process and equipment, data acquisition and analysis of measured data will be presented.

XVI IMEKO World Congress · TC4 · 2000 · Download
C. Volosencu

ESTIMATION OF THE ELECTRICAL ENERGY CONSUMPTION

This paper presents a simple example of design, modelling and simulation of a model of the electrical energy consumption based on feedforward neural networks. A database with electrical energy consummated on a year is used to train and to test the neural network. Levenberg-Marquardt method from the neural network toolbox of Matlab was used for training. Good quality criteria were obtained for a prediction for a short term with a simple neural network with only a hidden layer and a reduced number of neurones.

XVI IMEKO World Congress · TC4 · 2000 · Download
O. Vdovin, V. Martinyuk, G. Gordienko

HOW TO MEASURE CAPACITANCE EQUAL TO THE EARTH?

The report is devoted to measurement problems of the capacitor parameters for superhigh capacitances (1 F-200 F). The models of such objects are proposed. The mechanism of influence on the measurement result is determined for additional parameters. These parameters are the absorption capacitance CA and the absorption resistance RA, the leakage resistance RL and the active serial resistance R. Besides, the measuring structures that make it possible to take into consideration the influence of additional parameters are proposed. Moreover, the accuracy of the proposed measuring structures is...

XVI IMEKO World Congress · TC4 · 2000 · Download