DEVELOPING MODEL-BASED DESIGN EVALUATION FOR ALGORITHMIC A/D CONVERTERS

Ondřej Ĺ ubrt, Pravoslav Martinek, Carsten Wegener
Abstract:
In this paper we propose a novel Design Evaluation concept suitable for Nyquist-rate A/D converters employing the recently introduced technique of LEMMA (Linear Error Mechanism Modeling Algorithm). The core of our methodology is a root-cause identification of the error sources present in the ADC structure, evaluating the performance degradation by static non-linearity in a series of consecutive steps. Our solution benefits a wide scale of design optimization and device calibration possibilities, as it is demonstrated on a design example of Switched-Current (SI) algorithmic ADC. The results introduced in this paper are proven by full-transistor level and behavioral ADC simulation, back-annotating the parameters of its basic circuit element (SI memory cell) from the measurement of available silicon samples.
Keywords:
Design Evaluation, analog testing, error mechanism, linear modeling, Switched-Current, Nyquistrate A/D converter
Download:
PWC-2006-TC4-IWADC-005u.pdf
DOI:
-
Event details
Event name:
XVIII IMEKO World Congress
Title:

Metrology for a Sustainable Development

Place:
Rio de Janeiro, BRAZIL
Time:
17 September 2006 - 22 September 2006