DISCRETE LINEAR FILTERS FOR METROLOGY |
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| M. Krystek, P.J. Scott, V. Srinivasan |
- Abstract:
- Linear filters are used quite extensively in the field of dimensional metrology and surface texture for smoothing data collected from measurements. Past application of linear filters was largely limited to the Gaussian and 2RC filters. But recent advances in spline and wavelet theories have opened the way for more flexible and powerful linear filters that are getting more attention in industry. This paper describes these advances in linear filters and how they are influencing the development of ISO filter standards.
- Keywords:
- metrology, linear filters, ISO standards
- Download:
- IMEKO-WC-2000-TC14-P379.pdf
- DOI:
- -
- Event details
- Event name:
- XVI IMEKO World Congress
- Title:
Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future
- Place:
- Vienna, AUSTRIA
- Time:
- 25 September 2000 - 28 September 2000