CHARACTERISATION AND MODELLING OF THE ADC JITTER

P. Arpaia, P. Daponte, F. Maccaro, S. Rapuano
Abstract:
The use of the Allan variance for the characterisation of the jitter error in analog-to-digital converters (ADCs) is proposed. In particular, the Allan variance is a sound basis for defining a figure of merit for jitter errors, diagnosing the jitter noise type, and including a jitter block into a previously proposed ADC model. Experimental results highlighting the effectiveness of the Allan variance in the characterisation of the ADC jitter error are discussed.
Keywords:
jitter, A/D Converters, Allan variance
Download:
IMEKO-WC-2000-EWADC-P603.pdf
DOI:
-
Event details
Event name:
XVI IMEKO World Congress
Title:

Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

Place:
Vienna, AUSTRIA
Time:
25 September 2000 - 28 September 2000