DESIGN OF ADC HISTOGRAM TEST: A PRACTICAL CASE |
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| Giovanni Chiorboli |
- Abstract:
- In this paper, the results of the most recent studies on the sinewave histogram test are considered. Particular emphasis is dedicated to the choice of the values that the test parameters must assume for obtaining a specified measurement uncertainty. Finally, a practical example of how to organize the test of a high-speed, 12-bit converter is proposed, and some results are given which validate the theory.
- Keywords:
- Analog-to-Digital converter, histogram test, uncertainty
- Download:
- IMEKO-WC-2000-EWADC-P610.pdf
- DOI:
- -
- Event details
- Event name:
- XVI IMEKO World Congress
- Title:
Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future
- Place:
- Vienna, AUSTRIA
- Time:
- 25 September 2000 - 28 September 2000