REPRODUCIBILITY OF THE JITTER MEASUREMENT
J. Halámek, M. Kasal, M. Villa, P. Cofrancesco
Abstract:
The validity of the ADC noise model and jitter error are discussed and tested by measurement.
Keywords:
ADC measurement, ADC noise, jitter
Download:
IMEKO-WC-2000-EWADC-P620.pdf
DOI:
-
Event details
Event name:
XVI IMEKO World Congress
Title:

Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

Place:
Vienna, AUSTRIA
Time:
25 September 2000 - 28 September 2000
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