TESTING INL OR DNL - IS THERE A TRADE-OFF? |
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| Carsten Wegener, Michael Peter Kennedy |
- Abstract:
- Traditionally, production testing of data converters is based on measuring either the Integral or the Differential Nonlinearity (INL or DNL), respectively and computing the other. Doubts about this practice are raised as examples show that some error mechanisms in a given circuit have a characteristic INL-signature while others have a distinctive DNL-signature.
In this work we address the question “should one measure INL or DNL.” We extend the Linear Error Mechanism Modeling Algorithm to use both INL and DNL measurements simultaneously (if so required) to measure a device under test (DUT) with maximum accuracy given a fixed number of measurement points. - Keywords:
- integral and differential nonlinearity, mixed-signal test
- Download:
- IMEKO-WC-2000-EWADC-P649.pdf
- DOI:
- -
- Event details
- Event name:
- XVI IMEKO World Congress
- Title:
Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future
- Place:
- Vienna, AUSTRIA
- Time:
- 25 September 2000 - 28 September 2000