METHODS WITH A NEW APPROACH FOR MEASURE STATIC CHARACTERIZATION OF HIGH RESOLUTION DAC CONVERTERS |
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| Martin Sekerák, Linus Michaeli, Ján Šaliga, Marian Chovanec |
- Abstract:
- This paper presents two new methods for measuring the static characteristic of high resolution Digital to Analog Converters (DACs). Both proposed methods are based on the conversion of the DAC output voltage to time by using a fast comparator and a reference calibrator. The main advantage of this approach is that time can be measured in the electronic domain much more accurately than amplitude. Both methods are based on direct time measurement by a high frequency counter and on the registration of the input DAC code. From the obtained information a Personal Computer (PC) evaluates the Integral Non Linearity (INL) and the Differential Non Linearity (DNL). Another advantage of the proposed methods is the relatively low requirements on all laboratory equipment involved.
- Download:
- IMEKO-IWADC-2010-117.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- "Instrumentation for the Information and Communication Technology Era"
- Title:
- 15th International Workshop on ADC Modelling and Testing & XVIIth IMEKO TC4 Symposium (together with 3rd IMEKO TC19 Symposium) (IWADC)
- Place:
- Kosice, SLOVAKIA
- Time:
- 08 September 2010 - 10 September 2010