UNCERTAINTY EVALUATION IN DITHERED A/D CONVERTERS |
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| Filippo Attivissimo, Nicola Giaquinto, Mario Savino |
- Abstract:
- In this paper formulae for evaluating the uncertainty of measurements (direct and indirect) performed by means of an ADC-based device are presented. The complex technique of dithering is used to reduce the effect of noise and to increase the ADC resolution. The authors discuss a way of writing and interpreting the uncertainty specifications of ADCs.
- Keywords:
- uncertainty, measurement error, A/D converters
- Download:
- IMEKO-TC7-2004-017.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC7
- Event name:
- TC7 Symposium 2004
- Title:
10th Symposium on Advances of Measurement Science
- Place:
- St. Petersburg, RUSSIA
- Time:
- 30 June 2004 - 02 July 2004