A Solution of The Integrated μBIST for Functional and Diagnostic Testing in Mixed-Signal Electronic Embedded Systems |
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| Dariusz Załeski, Romuald Zielonko |
- Abstract:
- The paper concerns the testing of analogue circuits and blocks in mixed-signal electronic embedded systems (EESs), using the built-in self-test (BIST) technique. The integrated μBIST based on reusing signal blocks already present in an EES, such as processors, memories, ADCs, is presented. The novelty of the solution is the extended functionality of the μBIST. It can perform 2 testing functions: functional testing and fault diagnosis on the level of localization of a faulty element. For functional testing, the complementary signals (CSs), and for fault diagnosis the SBT vocabulary techniques have been used.
- Download:
- IMEKO-TC10-2013-006.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC10
- Event name:
- TC10 Workshop 2013
- Title:
12th IMEKO TC10 Workshop "New Perspectives in Measurements, Tools and Techniques for Industrial Applications"
- Place:
- Florence, ITALY
- Time:
- 06 June 2013 - 07 June 2013