Model of Errors Caused by Discrepancies of Input Channels in Multiresolution ADC |
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| Miroslav Kamenský, Karol Kovác, Gabriel Války |
- Abstract:
- Multiresolution analog-to-digital converter (MRADC) is usually used in the Time Domain ElectroMagnetic Interference (TDEMI) measuring system for very fast signal sampling with a sufficient dynamic range. The properties of the spectrum measured by TDEMI influenced by imperfections in MRADC are analyzed in the paper. Errors are cause by imperfect matching of the offset and gain of circuits used in parallel input channels typical for MRADC. For deep analyses of MRADC behavior, two mathematical models have been created using the concept of additive error pulses. The basic model is simpler. It uses rectangular pulses to describe the error component of the digitized signal. Furthermore, employing pulses of cosine shape too, the second extended mathematical model has been proposed covering both the slope and offset discrepancies of the input channels. For both models the resulting estimated error spectra are shown and compared with really measured ones.
- Keywords:
- multiresolution quantization, time domain EMI measurement, offset and slope errors, spectrum measurement
- Download:
- IMEKO-TC4-2013-046.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2013
- Title:
- 19th IMEKO TC4 Symposium Measurements of Electrical Quantities (together with 17th TC4 IWADC Workshop on ADC and DAC Modelling and Testing)
- Place:
- Barcelona, SPAIN
- Time:
- 18 July 2013 - 19 July 2013