Testing Oscillators by Waveform Comparison with the Ideal Sine-Wave |
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| Wojciech Toczek |
- Abstract:
- In context of the oscillation-based-test (OBT) technique, a simple and low-cost method of testing oscillators by comparison of finite segment of waveform with the ideal sine-wave is presented. The method is based on the subtraction of two sigma-delta modulated signals with the aid of a 1-bit subtractor that employs oversampling based noise-shaping. An up/down counter extracts the average of the bit stream that is used as a fault signature. The simulation results on the example of the Van der Pol oscillator show that the proposed fault signature is sensitive to the frequency and amplitude deviations and is able to detect non-linear oscillation as well.
- Download:
- IMEKO-TC4-2005-074.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Workshop 2005
- Title:
10th IMEKO TC4 International Workshop on ADC Modelling and Testing - IWADC (together with XIVth IMEKO TC4 International Symposium on New Technologies in Measurement and Instrumentation)
- Place:
- Gdynia/Jurata, POLAND
- Time:
- 12 September 2005 - 15 September 2005