Towards a harmonized treatment of dynamic metrology |
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| Sascha Eichstädt, Clemens Elster |
- Abstract:
- Dynamic metrology is a topic of growing importance at NMIs and in industry, and it is considered in an increasing number of application areas. Guidance documents, such as the Guide to the Expression of Uncertainty in Measurement (GUM) [1] and the International Vocabulary of Metrology (VIM) [2], are currently not addressing dynamic measurements, and there is an increasing need for a harmonized treatment of dynamic metrology. To this end, we suggest a generic and versatile approach for the mathematical and statistical modeling of dynamic measurements, which also provides a basis for a harmonized vocabulary.
- Keywords:
- dynamic measurement, uncertainty, signal processing, state-space system
- Download:
- IMEKO-TC4-2014-498.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2014
- Title:
20th IMEKO TC4 Symposium on Measurements of Electrical Quantities (together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC)
"Research on Electrical and Electronic Measurement for the Economic Upturn"- Place:
- Benevento, ITALY
- Time:
- 15 September 2014 - 17 September 2014