OPTICAL DIFFERENTIATION PHASE MEASUREMENT USING A MODIFIED MULTI-STEP BIAS-SHIFTING METHOD

Hideo Furuhashi, Yoshiyuki Uchida, Kiyofumi Matsuda, Akihiro Kono
Abstract:
An optical differentiation phase measurement system using a modified multi-step bias-shifting method is proposed. The signal obtained by multi-step bias shifting is divided into two groups in this new method. The effectiveness of the new method was demonstrated using a computer simulation.
Keywords:
phase measurement, wavefront, optical differentiation
Download:
PWC-2006-TC2-008u.pdf
DOI:
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Event details
Event name:
XVIII IMEKO World Congress
Title:

Metrology for a Sustainable Development

Place:
Rio de Janeiro, BRAZIL
Time:
17 September 2006 - 22 September 2006