An Automated Digital Testing System for High-Resolution ADC Based on the Feedback Loop Method Using Low-Resolution DAC Signal |
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| Nan Wang, Cheng Huang, Jianhui Wu |
- Abstract:
- This paper presents an automated digital testing system for high-resolution ADC with lowresolution DAC signal. This system mainly comprises a low-resolution DAC (or signal source), a feedback loop circuit, a bias voltage device and a reference voltage source controlled by a digital potentiometer. By the digital potentiometer constantly fine-tuning the reference voltage and joining bias voltage timely, the output of DAC can completely measure all the codes of high-resolution ADC under test. This system solves the problem that low-resolution DAC signal tests high-resolution ADC inaccurately, which not only greatly reduce the test cost, but also can be applied to a variety of ADC hardware testing environments. The simulation results show that, 10-bit DAC signal in this system can measure each code of 14-bit ADC twice at least. The proposed testing system shows a new feasible solution to high-resolution ADC test.
- Keywords:
- Automated Testing System, Feedback Loop Method, Low-Resolution DAC Signal, High-Resolution ADC.
- Download:
- IMEKO-TC4-2014-198.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2014
- Title:
20th IMEKO TC4 Symposium on Measurements of Electrical Quantities (together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC)
"Research on Electrical and Electronic Measurement for the Economic Upturn"- Place:
- Benevento, ITALY
- Time:
- 15 September 2014 - 17 September 2014