Optimal Non-parametric Estimation of 1/f Noise Spectrum in Semiconductor Devices |
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| Paolo Magnone, Pier Andrea Traverso, Claudio Fiegna |
- Abstract:
- In this paper, we discuss the optimal nonparametric estimation of 1/f noise in MOSFET devices. We adopt a simple experimental procedure to evaluate the performance of different methods for the spectrum estimation. In particular, we analyze the variance of the spectrum in the case of averaged periodograms, according to Bartlett and Welch methods. The influence of the adopted window function and of the overlap between segments is investigated. Finally, an optimal power spectrum estimation is identified, allowing to minimize the dispersion of the spectrum.
- Keywords:
- 1/f noise; MOSFET; non-parametric methods; PSD; Welch method.
- Download:
- IMEKO-TC4-2014-326.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2014
- Title:
20th IMEKO TC4 Symposium on Measurements of Electrical Quantities (together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC)
"Research on Electrical and Electronic Measurement for the Economic Upturn"- Place:
- Benevento, ITALY
- Time:
- 15 September 2014 - 17 September 2014