EVALUATION OF FREQUENCY DEPENDENCY OF EFFECTIVE NUMBER OF BITS BY MEANS OF STOCHASTIC TESTING SIGNAL
Jan Holub, Josef Vedral
Abstract:
The article describes a new method of Analog-to-Digital Converters testing that is suitable for testing of highresolution AD converters (e.g. Σ-Δ or dither-based) or on the contrary ultra high-speed AD converters. The method is based on the histogram test driven by stochastic signal with defined probability density function. By repeating of the test for different settings of band-pass filter that is inserted to the input testing signal path it is possible to obtain an estimation of frequency dependency of effective number of bits. This important information was obtainable by deterministic test only. Practical demonstration confirmed the usability of the method.
Keywords:
ADC, ENOB, testing, stochastic signal
Download:
IMEKO-TC4-2001-048.pdf
DOI:
-
Event details
IMEKO TC:
TC4
Event name:
TC4 Symposium 2001
Title:

11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation (together with 6th IMEKO TC4 Workshop on ADC Modelling and Testing)

Place:
Lisbon, PORTUGAL
Time:
13 September 2001 - 14 September 2001
 Back