FREQUENCY DOMAIN ANALYSIS FOR INTEGRAL NONLINEARITY MEASUREMENT IN A/D CONVERTERS WITH DITHER |
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| Francesco Adamo, Filippo Attivissimo, Nicola Giaquinto, Mario Savino |
- Abstract:
- The paper examines the problem of achieving a fast measurement of nonlinearity for a dithered converter. It is shown that, since dither removes small-scale systematic errors, measuring the remaining large-scale (smooth) nonlinearity can be efficiently achieved via a fast frequency domain test, formerly analyzed by the authors for conventional converters without dither. The test appears especially suited for dithered converters, and can be useful for the periodic adjustment of a look-up table intended for removing large-scale nonlinearities.
- Keywords:
- analog-digital conversion, data acquisition, nonlinear systems, dithering
- Download:
- IMEKO-TC4-2001-054.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2001
- Title:
11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation (together with 6th IMEKO TC4 Workshop on ADC Modelling and Testing)
- Place:
- Lisbon, PORTUGAL
- Time:
- 13 September 2001 - 14 September 2001