METROLOGICAL MODELLING OF Σ-Δ ADC |
|---|
| Valeriy I. Didenko, Izzet Kale, Andrey L. Movchan, Juriy S. Solodov |
- Abstract:
- The paper uses a metrological approach to modelling of Σ-Δ ADC. The main goal of such modeling is possibility to evaluate the uncertainty of A-D conversion with given probability. The main attention is devoted to errors produced by noise. Analysis uses both frequency and time domains. The application of the metrological modelling is demonstrated at the example of the concrete ADC manufactured by Analog Devices company. The paper is based on application of metrology in design made in MPEI (Russia) as well as on widespread investigations of Σ-Δ ADC fulfilled in University of Westminster (England).
- Keywords:
- sigma-delta analog-to-digital converter, quantization noise, metrological modelling
- Download:
- IMEKO-TC4-2001-058.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2001
- Title:
11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation (together with 6th IMEKO TC4 Workshop on ADC Modelling and Testing)
- Place:
- Lisbon, PORTUGAL
- Time:
- 13 September 2001 - 14 September 2001