AFTER IEEE STD 1241: WHAT’S NEXT ?

Thomas E. Linnenbrink, Steven J. Tilden, Michael Hartshorne, Jerome J. Blair, Erik McCarthy, Don Hummels
Abstract:
While the release of IEEE Std 1241-2000 early in 2001 is a major milestone, it is not the end of the ADC standards project. Work continues on improving test methods. A common thrust is to reduce test time (and cost) while maintaining or improving the precision and accuracy of the result. Examples of methods under consideration include a more efficient means of determining offset, equivalent-time testing with imprecise pulses, and automatic sine wave fitting. This paper presents progress to date.
Keywords:
ADC, Sinefit, FFT, histogram, step response, equivalent time sampling, IEEE Std 1241-2000, IEEE Std 1057-1994
Download:
IMEKO-TC4-2001-129.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
TC4 Symposium 2001
Title:

11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation (together with 6th IMEKO TC4 Workshop on ADC Modelling and Testing)

Place:
Lisbon, PORTUGAL
Time:
13 September 2001 - 14 September 2001