IMPROVEMENT OF THE TIME-INTERVAL MEASUREMENT SYSTEM PARAMETERS BY MULTIPLICATION THE NUMBER OF ITS COMPONENTS

D. Chaberski, M. Gurski, M. Zielinski
Abstract:
The paper contains description of TI (Time-Interval) measurement system implemented in FPGA (Field-Programmable-Gate-Array) structure whose such parameters as measuring uncertainty and maximal intensity of registered TSs (Time-Stamp) have been improved by the multiplication the number of its components. In this research the resolution has been increased by multiple TDL (Tapped-Delay-Line) use and the maximal intensity has been increased by hardware parallel processing implementation.
Keywords:
FPGA, time-interval, histogram, time-stamp, tapped-delay-line
Download:
IMEKO-WC-2015-TC7-187.pdf
DOI:
-
Event details
Event name:
XXI IMEKO World Congress
Title:

Measurement in Research and Industry

Place:
Prague, CZECH REPUBLIC
Time:
30 August 2015 - 04 September 2015
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