APPLICATION OF RANDOM FOREST TO THE FAULT DETECTION IN ANALOG CIRCUITS

Piotr Bilski
Abstract:
The paper presents the application of the Random Forest (RF) to the diagnostics of analog circuits. The modified structure of the forest proposed for the task and its generation algorithm is presented. The approach is used to detect parametric faults in the fifth order lowpass filter. Multiple versions of the forest are tested. The proposed method is also confronted against the decision tree, being superior over the traditional classifier. The future prospects of the approach are considered.
Keywords:
decision tree, random forest, fault detection, analog circuits
Download:
IMEKO-WC-2015-TC10-231.pdf
DOI:
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Event details
Event name:
XXI IMEKO World Congress
Title:

Measurement in Research and Industry

Place:
Prague, CZECH REPUBLIC
Time:
30 August 2015 - 04 September 2015