OPTIMIZATION METHODS IN METROLOGY OF ELECTRICAL QUANTITIES |
|---|
| Marija Cundeva-Blajer |
- Abstract:
- In electrical quantities metrology numerous examples of stochastic processes exist and a need for optimal solutions is posed. Here stochastic genetic algorithm optimization is used for solving two typical metrological problems: errors minimization in process of instrument’s design and predicting metrological reference standards time-drift. The first case is optimal metrological design of a combined instrument transformer and the second case is analysis of resistance standard time-drift.
- Keywords:
- optimization, genetic algorithm, electrical measurements, instrument transformer, resistance standard
- Download:
- IMEKO-WC-2015-TC21-386.pdf
- DOI:
- -
- Event details
- Event name:
- XXI IMEKO World Congress
- Title:
Measurement in Research and Industry
- Place:
- Prague, CZECH REPUBLIC
- Time:
- 30 August 2015 - 04 September 2015