Characterization and Volume Test of the AM06 Chip |
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| Seyed Ruhollah Shojaii, Alberto Annovi, Davide Banfi, Matteo Beretta, Francesco Crescioli, Luca Frontini, Valentino Liberali, Lorenzo Marcellino, Alberto Stabile |
- Abstract:
- This paper presents a methodology for the characterization and the industrial testing of a very complex Application-Specific Integrated Circuit (ASIC). The proposed test system is being installed at a company and it is very user friendly also for a non specialized operator.
This framework has been developed within a collaboration by the Istituto Nazionale di Fisica Nucleare (INFN) and the Laboratoire de Physique Nucléaire et de Hautes Energies (LPNHE), and the same test setup is installed in the laboratories of INFN-Milan, INFNFrascati and LPNHE-Paris. - Download:
- IMEKO-TC10-2016-006.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC10
- Event name:
- TC10 Workshop on Technical Diagnostics 2016
- Title:
14th IMEKO TC10 Workshop “New Perspectives in Measurements, Tools and Techniques for system’s reliability, maintainability and safety”
- Place:
- Milano, ITALY
- Time:
- 27 June 2016 - 28 June 2016