Automatic Generation of LH-BIST Architecture for ADC Testing |
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| S. Bernard, F. Azaïs, M. Comte, Y. Bertrand, M. Renovell |
- Abstract:
- No generic BIST architecture exists for Analog-to-Digital Converters testing. For each application and test setup we thus have to build a dedicated BIST architecture. In this paper, we show that the LH-BIST architectures based on the Linear Histogram-based test technique are configurable and we evaluate hardware resources according to any given application. We also propose a software tool allowing the automatic generation of the LH-BIST description.
- Keywords:
- ADC testing, Histogram-based test, BIST, configurable BIST architecture
- Download:
- IMEKO-IWADC-2003-03.pdf
- DOI:
- -