High Reliable DAQ for ADC On Line Testing |
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| M. Catelani, E. Campani, M. Del Pistoia, R. Singuaroli, M. Mugnaini, A. Fort |
- Abstract:
- This paper describes a general purpose high reliable DAQ for widely used sensor families. The development of a system which allows performing fast multi-channel data acquisition and ACD testing by means of single and two tone tests grants high reliability.
- Keywords:
- acquisition board performance, Two tone test, ADC characterization
- Download:
- IMEKO-IWADC-2003-34.pdf
- DOI:
- -