The development of 14 bit monolithic Analogue to Digital Converters (ADC’s) capable of sampling at 80 MHz has revived interest in digitising the entire 3-30 MHz High Frequency (HF) radio spectrum for use in wideband HF receivers. This enables the ADC to be placed close to the antenna so removing the need for analogue mixing as well as offering a multi-channel reception capability, using multiple digital synthesisers and direct conversion I, Q mixing to baseband ...

This paper deals with testing of ultra-low distortion sine wave generators. Measurement of harmonic distortion based on lock-in amplifiers is described and practical results using fundamental-suppression method are presented.

The paper presents a mathematically grounded approach to the analysis and optimisation of multi-pass analogue-to-digital converters (MADCs) with the algorithmic forming the estimates of converted samples. The approach enables a comprehensive analysis of the converter work using a virtual model of MADC built on the basis of its mathematical model. This model is based on the extended optimal identification algorithms adapted to the particularities of A/D conversion. The obtained sub-optimal algorithms take into account all main parameters of the internal auxiliary ADC and other analogue elements of MADC. The results of advanced simulations confirm a full agreement of theoretical and experimental evaluations, as well as efficiency of the proposed approach as a tool for MADC design support.

The paper describes the design of a 1GS/s 6-bit ADC in SiGe BiCMOS technology. Several techniques such as subranging, interpolation and averaging were implemented on the original flash architecture in order to achieve low power consumption without sacrificing linearity and dynamic performance.

The paper presents some ideas and results from the attempt to create a comprehensive suite of data processing, C-language functions that enables simplifying the development of new, user oriented software for testing analog to digital converters according the IEEE standards 1057, 1241 and DYNAD. The developed function class covers both dynamic and histogram based test methods. Nowadays, it is prepared in the form of instrument driver - function panel (*.fp) for the software development package Lab Windows⁄CVI by National Instruments. All functions were developed, debugged and tested in this environment.
The paper also contains some results from comparing the new developed function class used in a developed examples of end-user applications with test data processing Matlab software by Kollar and Markus.