Mauro Citterio, Massimo Lazzaroni, Francesco Tartarelli
We discuss the main reliability issues in present and future electronics equipment in elementary particle physics experiments. Aspects related to presence of high magnetic fields, ionizing and nonionizing radiation and their effects on active electronics devices are briefly reviewed. Moreover, we also describe the constraints on the design issues due to the long lifetime of the experiments and to the reduced accessibility to the system, which is possible only during well-defined scheduled downtime periods.
TC10 Workshop on Technical Diagnostics 2016
· TC10
· 2016
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Marco Faifer, Mohamed Khalil, Luigi Piegari, Payam Soulatiantork, Sergio Toscani
In recent years DC/DC converters are becoming one of the most diffused power converter because of the spreading of renewables and storages. New topologies of DC/DC converters have been proposed to improve the energy efficiency. Anyway, in many applications the most diffused are always the traditional hard switching configurations for which some tricks are introduced in order to increase the efficiency. Usually, the switching frequency is considered a parameter to be kept low in order to reduce the losses. In this paper, the efficiency variation of a power converter with the switching...
TC10 Workshop on Technical Diagnostics 2016
· TC10
· 2016
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Mohamed Khalil, Payam Soulatiantork
The target reliability levels of Photovoltaic inverters, that encounter Photovoltaic panels reliability, is a challenging issue. Currently a lot of efforts are carried out to improve the lifespan of photovoltaic inverter and reduce their outages. Special attention in this respect is given to the failure causes of inverters. In this paper, a complete FMECA analysis is presented to understand the root causes of these failures, estimate the local and final effects on generating energy, and recommended actions to avoid these failure modes. Additionally, an assignment of risk priority numbers is...
TC10 Workshop on Technical Diagnostics 2016
· TC10
· 2016
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Mohamed Khalil
Since Photovoltaic (PV) systems have penetrated generation networks, their failures started to have a detrimental effect on the economics of power generation and risk of power interruptions. The dominant failure causes behind these failures is the Photovoltaic Inverter ( PVI). In this respect, reliability prediction of PVI has been of great concerns, nowadays, to designers and manufacturers during the design phase. In this paper, Markov process is chosen to estimate the reliability of PVI based on the recent failure data of Siemens norm SN-29500 handbook. Both the reliability and MTTF are...
TC10 Workshop on Technical Diagnostics 2016
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· 2016
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Roberto Ottoboni, Sathish Kumar Packiam
The usage of IGBTs in power electronics field is increasing day by day and drawing the attention of researchers to characterize its application in different fields. One of the most important parameters for the designers is to determine the energy losses introduced by these devices. The manufacturers of IGBT do not always provide this parameter in the same way and very often at comparable values of the parameter may correspond different behaviors. Moreover, in the tests carried out by manufacturers, some aspects that are responsible for a significant measurement uncertainty are neglected or...
TC10 Workshop on Technical Diagnostics 2016
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· 2016
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Marta Brusati, Alessandra Camplani, Matthew Cannon, Hucheng Chen, Mauro Citterio, Massimo Lazzaroni, Helio Takai, Mike Wirthlin
SRAM-based Field Programmable Gate Array (FPGA) logic devices are very attractive in applications where high data throughput is needed, such as the latest generation of High Energy Physics (HEP) experiments. FPGAs have been rarely used in such experiments because of their sensitivity to radiation. The present paper proposes a mitigation approach applied to commercial FPGA devices to meet the reliability requirements for the front-end electronics of the Liquid Argon (LAr) electromagnetic calorimeter of the ATLAS experiment, located at CERN. Particular attention will be devoted to define a...
TC10 Workshop on Technical Diagnostics 2016
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· 2016
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Mattia Rossi, Marco Mauri, Francesco Castelli Dezza, Maria Stefania Carmeli
Sensorless AC drives do not require speed sensor and have the advantage of high reliability and low cost. The sensorless control techniques require the estimation of internal state variables and the accuracy of this estimation influences the overall control performances. Moreover, implementation of a state observer which computes speed signal and the use of digital filter introduce intrinsic delays which affect electrical drive performances. The result is a deterioration of control performances even if control parameters are correctly tuned. The control of a dualinertia elastic system is a...
TC10 Workshop on Technical Diagnostics 2016
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· 2016
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Giuseppe Maria D'Aucelli, Nicola Giaquinto, Sabino Mannatrizio, Mario Savino
In this paper, a MATLAB framework for automated Measurement System Analysis (MSA) procedures according to ISO 5725 standard is presented. Data consistency tests and their relations with the statistical model used in the standard are illustrated, with sample output from the corresponding MATLAB functions. Moreover, the ANOVA framework is introduced in the MSA workflow as recommended in the ISO/TR 22971 standard. Measurement system performance assessment is, finally, performed using the framework and given in terms of repeatability, interlaboratory and reproducibility variances.
TC10 Workshop on Technical Diagnostics 2016
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· 2016
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Alberto Carboni
In these years electronics is facing a great change because of the introduction of new materials, i.e. Silicon Carbide (SiC) and Gallium Nitride (GaN). These materials feature great electrical and thermal properties. The current semiconductor solutions have pushed Si and GaAs at their very limits in terms of thermal behavior and efficiency. The new semicondcutors, i.e. silicon carbide and gallium nitride, has opened the way to new possibilities and challenges. In addition, SiC and GaN prove to perform well also in the presence of radiations. This first part of this review deals with silicon...
TC10 Workshop on Technical Diagnostics 2016
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· 2016
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Petr Kuritcyn, Katharina Anding, Gunther Notni
Any recognition task, where the classes are given by quality rules or standards, needs the use of supervised machine learning. This paper discusses the ways of improvement the performance of methods of spectral analysis and supervised machine learning by classifying the construction and demolition waste (CDW). The first investigations in visible (VIS) and infrared (IR) spectrum have shown, that we can achieve a high recognition rate (98.3%). Therefore, investigations were done for analysing, which methods are useful for improvement classification performance of C&D aggregates.
TC10 Workshop on Technical Diagnostics 2016
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· 2016
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