This paper deals with analysis of influence of quantization noise on estimation of parameters of signal gained by various algorithms based on Discrete Fourier Transform (DFT) for the case of coherent and non–coherent sampling. Theoretical analysis, numerical simulation results and experimental validation are presented. The analyzed methods are compared from the point of view of their sensitivity to quantization noise.

In this paper we propose a novel Design Evaluation concept suitable for Nyquist-rate A/D converters employing the recently introduced technique of LEMMA (Linear Error Mechanism Modeling Algorithm). The core of our methodology is a root-cause identification of the error sources present in the ADC structure, evaluating the performance degradation by static non-linearity in a series of consecutive steps. Our solution benefits a wide scale of design optimization and device calibration possibilities, as it is demonstrated on a design example of Switched-Current (SI) algorithmic ADC. The results introduced in this paper are proven by full-transistor level and behavioral ADC simulation, back-annotating the parameters of its basic circuit element (SI memory cell) from the measurement of available silicon samples.

The paper deals with methods of a sine-wave signal generation for dynamic testing high-speed (1 MSa/s to 100 MSa/s) ADCs with high resolution (14 to 20 bits). The techniques of noise and distortion measurement of spectrally-pure sine-wave signals are also discussed.

In this paper a method for evaluation the dynamic performances of an analog-to-digital converter (ADC) by ramp testing signals is proposed. This method permits the estimation with high accuracy of ones of the most important dynamic parameters of an ADC – signal-to-noise and distortion ratio (SINAD) and effective number of bits (ENOB). Carried out simulations confirm that the proposed method leads to accurate results.

IMEKO is a non-governmental federation of 35 national Member Organisations, individually concerned with the advancement of measurement technology and instrument engineering. The Member Organisations are scientific/technical societies or committees. The membership consists of the representatives of metrological institutions, higher education, industry and the users of instruments. The paper deals with the objectives of the Confederation, informs on the structure and financial background, on IMEKO imeko_proceedings and on the activities of 21 active Technical Committees. Finally, the future World Congress, different scientific services, membership development, events and co-sponsorships are discussed.