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Proceedings

9762 papers found

Hideo Furuhashi, Yoshiyuki Uchida, Kiyofumi Matsuda, Akihiro Kono

OPTICAL DIFFERENTIATION PHASE MEASUREMENT USING A MODIFIED MULTI-STEP BIAS-SHIFTING METHOD

An optical differentiation phase measurement system using a modified multi-step bias-shifting method is proposed. The signal obtained by multi-step bias shifting is divided into two groups in this new method. The effectiveness of the new method was demonstrated using a computer simulation.

XVIII IMEKO World Congress · TC2 · 2006 · Download
Hans Peter Grieneisen, Aline S.P.Timmins, André S. Sardinha, Iakyra B. Couceiro

ILLUMINANCE MEASUREMENTS OF ROADWAYS

The aim of this paper is to present the first initiatives of the photometric group at Inmetro to analyze and test measurement procedures of lighting performance of roadways. At present, the evaluation for the average illuminance follows the brazilian standard ABNT-NBR-5101. The illuminance values measured in the field test are compared with calculated values, using the intensity distribution of the luminaires, which have been measured with a goniophotometer. Close agreement is found.

XVIII IMEKO World Congress · TC2 · 2006 · Download
S. Patzelt, F. Horn, G. Goch

FAST INTEGRAL OPTICAL ROUGHNESS MEASUREMENT OF SPECULAR REFLECTING SURFACES IN THE NANOMETER RANGE

A fast optical roughness measuring device with a compact design is presented. The measuring principle is based on double scattering of coherent light. The measurement results in an integral statistical roughness value like Ra or Rq according to ISO 4287. It is valid for the illuminated surface area with diameters between 0.5 mm and 10 mm at a resolution of about 1 nm (Ra-value). A simulation model of the optical roughness measuring process based on the Huygens-Fresnel approximation was implemented. The simulation tool enables to investigate potential improvements of the measuring method...

XVIII IMEKO World Congress · TC2 · 2006 · Download
Klaus Körner, Evangelos Papastathopoulos, Wolfgang Osten

SOME ASPECTS OF CHROMATIC CONFOCAL SPECTRAL INTERFEROMETRY

In this paper, we report on the recent development of a novel low coherence interferometry technique for the purpose of 3D-topography measurements. It combines the well established techniques of spectral-interferometry (SI) and chromatic-confocal microscopy (CCM). It allows for the detection of an object’s depth position, without the necessity of a mechanical axial-scan, and the measurement is performed in a so-called “single-shot” manner. Focusing the white-light with a microscope objective combined with a diffractive optical element leads to an expansion of the axial-range of the sensor...

XVIII IMEKO World Congress · TC2 · 2006 · Download
Robert Schmitt, Tilo Pfeifer, Alexandre Orth

FEASIBLE PRODUCTION OF FIBRE-REINFORCED COMPOSITES THROUGH INLINE INSPECTION WITH MACHINE VISION

The application of Fibre-Reinforced Plastics is important in many engineering areas, but vital for the aerospace industry. This work shows how inline metrology can contribute to a feasible production of composite parts. An inspection system based on a Machine Vision System will be presented as a key-component for the automatic construction of complex Preform structures.

XVIII IMEKO World Congress · TC2 · 2006 · Download
Hiroaki Nishioka, Satoru Takahashi, Kiyoshi Takamasu

A SUPER-RESOLUTION MICROSCOPY WITH STANDING EVANESCENT LIGHT AND IMAGE RECONSTRUCTION METHOD

We propose a super-resolution microscopy that employs standing evanescent light illumination and image reconstruction method with successive approximation. Samples are illuminated with standing evanescent light, which is formed and shifted into different positions on the interface of total internal reflection (TIR). Scattering light emitted from the illuminated samples is detected through far-field imaging optics. We assume two hypotheses of linearity and incoherence about the scattering light. Then we reconstruct the sample distribution from scattering images and standing evanescent light...

XVIII IMEKO World Congress · TC2 · 2006 · Download
Toshie Yoshioka, Takashi Miyoshi, Yasuhiro Takaya

MEASUREMENT OF PATTERNED WAFER SURFACE DEFECTS USING ANNULAR EVANESCENT LIGHT ILLUMINATION METHOD

To detect particulate defects on patterned wafers of below 100 nm design rule, we proposed a new detection method using evanescent light illumination. To verify the feasibility of the method, we performed fundamental experiments. The results show that particle with a size of 170 nm on the patterned wafer surface with about 400 nm pitch is detected.

XVIII IMEKO World Congress · TC2 · 2006 · Download
Salvador Echeverría-Villagómez, Mahdha Flores-Campos, Rita Pantoja-Lesso, Nadira Rodríguez-Damián, Benito Valgañón-Argueta

HUMAN RESOURCE AND KNOWLEDGE MANAGEMENT SYSTEM FOR COMPETENCES IN METROLOGY USING INFORMATION TECHNOLOGIES

This article presents a proposal for the development of a Knowledge management system for the management of Metrologic knowledge. It was conceived to solve the problematic detected at some metrological organizations in México. It shows the revision of some information about HR problems, Knowledge management and Technology of education tendencies. The system is under development in the time this paper was written, however it is considered pertinent to present this information as a strategy that could be adopted by any organization concerned with metrology and on the other hand it expected to...

XVIII IMEKO World Congress · TC1 · 2006 · Download
Queenie Siu Hang Chui, Jaim Lichtig

ASSESSING UNCERTAINTIES RELATED TO LINEAR CALIBRATION CURVES: A CASE STUDY FOR FLAME ATOMIC ABSORPTION SPECTROMETRY

Least square linear regression is widely used in analytical chemistry. In practice a linear relationship between substance content and measured value still has been assumed based on the correlation coefficient criterion, although not recommended. Textbooks provide the necessary formulas for the fitting process, based on the assumption that there is no error in the independent variable. In practice the ordinary least squares (OLS) textbook procedure is used even when the previously stated assumptions are not strictly fulfilled. In this paper, how to validate the calibration function is dealt...

XVIII IMEKO World Congress · TC1 · 2006 · Download