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Veronica Scotti
Forensic Metrology: Where Law Meets Measurements

This paper is intended to give a short overview about the emerging branch of a new forensic science called forensic metrology. It is important to highlight the role played by scientists in proceedings and the relevance of scientific rules that, in the past, were not considered at all. This is especially true when measurement uncertainty is considered, since it apparently conflicts with the legal principle of certitude. Nowadays the attitude of courts is changing because of the reached awareness of the important information brought by uncertainty in investigating an event, even though building a bridge between scientists and legal people, who refer to different backgrounds, is quite a challenge, and is hard to win.

Pasquale Arpaia, Carlo Baccigalupi, Michele Martino
Extreme Value Statistical Characterization of Time Domain Pulse-to-Pulse Measurements

An analytical method, based on Extreme Value Theory (EV T), for predicting the worst case repeatability of time domain pulse-to-pulse measurements, modeled as independent and identically distributed random variables, is proposed. The method allows the use of the noise level of a measurement system for predicting the upcoming peak values over a given number of independent observations. The proposed analytical model is compared against simulated distributions generated in Matlab, highlighting satisfying match for any sample size.The simulations are based on a case study on the characterization of a pulsed power supply for the klystron modulators of the Compact LInear Collider (CLIC) under study at CERN.

Marcantonio Catelani, Lorenzo Ciani, Bianca Sereni, Andrea Zanobini
Repeatability and Reproducibility Techniques for Measurement System Analysis

This research was conducted with the aim of analyzing two of the main metrological characteristics of any measurement system: Repeatability and Reproducibility. Both of these features play an important role in the analysis of the measurements and they can give us a lot of information about who and what influences any measuring system. The analysis of Repeatability and Reproducibility is generally carried out through the use of the study Gage R&R. This study is very useful because it permits us to understand which are the decisive factors in a measurement system, and, definitively, if the process is stable, that is under statistical control or out of statistical control.

Sascha Eichstädt, Clemens Elster
Towards a harmonized treatment of dynamic metrology

Dynamic metrology is a topic of growing importance at NMIs and in industry, and it is considered in an increasing number of application areas. Guidance documents, such as the Guide to the Expression of Uncertainty in Measurement (GUM) [1] and the International Vocabulary of Metrology (VIM) [2], are currently not addressing dynamic measurements, and there is an increasing need for a harmonized treatment of dynamic metrology. To this end, we suggest a generic and versatile approach for the mathematical and statistical modeling of dynamic measurements, which also provides a basis for a harmonized vocabulary.

Zygmunt Lech Warsza, Mykhaylo Dorozhovets
Evaluation of the uncertainty type A of the random stationary signal component from its autocorrelated observations

The proposal of evaluating the uncertainty type A of the stationary random component of measured signal from its regularly sampled observations (auto-correlated) is presented. In the first step the regularly variable components of the signal are indentified and removed from the raw sample data. Then upgraded formulas for standard uncertainty type A of the sample and of the mean value are expressed with the use of the correction coefficients or the so-called “effective number” of observations. These quantities depend on number of observations and on the autocorrelation function of the sample cleaned from regular components. Two methods of finding and estimating the autocorrelation function for the sample data are also presented. Few numerical examples are included.

Pasquale Arpaia, Pasquale Cimmino, Lucio Fiscarelli
Enhanced fast digital integrator for magnetic measurements

An enhanced Fast Digital Integrator (eFDI) was designed to satisfy the new requirements in terms of dynamic accuracy, noise, self-calibration accuracy, and data throughput arising from current on-field exploitation of the previous integrator (FDI) [1] in magnetic measurements for particle accelerators at CERN. In this paper, initially, the specifications, the design solutions, and the main features of the eFDI prototype are illustrated. Then, the preliminary results of the metrological characterization are compared with the FDI performance in order to highlight the achieved improvements.

Rihab Lahouli, Manel Ben-Romdhane, Chiheb Rebai, Dominique Dallet
Digital reconstruction stage of the FBD %Sigma;%Delta;-based ADC architecture for multistandard receiver

This paper presents the design of a digital reconstruction stage for a frequency band decomposition (FBD)-based analog-to-digital converter (ADC) architecture for digitizing multistandard receiver signals. The proposed FBDbased ADC architecture is flexible with programmable parallel branches composed of discrete time (DT) 4th order single-bit %Sigma;%Delta; modulators. The mixed baseband architecture uses a single non programmable anti-aliasing filter (AAF) avoiding the use of an automatic gain control (AGC) circuit. System level analysis proved that proposed FBD architecture satisfies design specifications of the proposed software defined radio (SDR) receiver. In this paper, the authors focus essentially on the reconstruction stage design for UMTS use case while discussing digital stage processing and performances.

Roumen Nojdelov, Stoyan Nihtianov, Andrew Yacoot, Dirk Voigt
Capacitance-to-Digital Converter for Accurate Displacement Measurement in the Sub-nanometre Range

This paper presents a capacitance-to-digital converter (CDC) for accurate displacement measurement in the sub-nanometer range. It is intended for applications in metrology, as part of the efforts to create a new transfer standard for length. The main targeted performance characteristics of the CDC are: stability and resolution. Compared with previously reported works, the CDC is optimized with respect to the dynamic range while dissipating only 45 mW of electric power in proximity to the sensor area. The implemented conversion principle uses one resistor, resistance ratio and time as references, thus achieving a good initial accuracy and a very high stability over temperature and time. The interface is realized at PCB level with off-the-shelf components, and measures up to six sensors sequentially. The capacitance measurement range is 9 pF with an option for 18 pF and 32 pF. The resolution of the converter for 9 pF range is 60 aF (~17 bits dynamic range) with less than 2 ms conversion time.

Dariusz Kościelnik, Jakub Szyduczyński, Dominik Rzepka, Wojciech Andrysiewicz, Marek Miśkowicz
Architecture of successive approximation time-to-digital converter with single set of delay lines

The paper addresses a time-to-digital conversion method based on successive approximation algorithm in time domain (SA-TDC). The SA-TDC is based on successive delaying the events defining a start and a stop of the input time interval being converted to a digital number by the use of binaryscaled delay components. The paper contribution is a presentation of several enhancements of SA-TDC architecture with single set of delay lines such as a reduction of hardware complexity and a decrease of quantization step by asymmetric inverter design in delay lines. On the other hand, the problem of metastability in logic appeared during conversion process for quasi-simultaneous inputs as a significant drawback of SA-TDCs is explored.

Manel Ben-Romdhane, Asma Maalej, Chiheb Rebai, Dominique Dallet
Characterization of Mismatches in Time-Interleaved ADC

Time-interleaved analog to digital converter (TI-ADC) is a technique of increasing sampling frequencies and bandwidth while keeping high resolution. In this paper, the authors aim to characterize a TI-ADC with mismatches. They propose equivalent scheme and identification to timequantized pseudorandom sampling technique. The goal of this identification is to enable the adaptation of mismatch compensation technique of TI-ADC to recover mismatches in ADC acquisition using timequantized pseudorandom sampling.

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