In this research, a low cost high-precision auto-focus laser probe system was developed. Modified from the pickup head of a market available compact disc player as basis, it can detect the Focus Error Signal (FES) of the object with a built-in four-quadrant photodiode. The FES will feedback to the developed controller through which the objective lens can be adjusted to remain in focus using a voice coil motor (VCM). The driving current (converted from Servo FES) of the VCM and objective lens displacement is one to one linearly related within few hundred micrometers. Because of this relationship, the surface profile of the tested object can be realized. Experimental results showed that the designed probe has 200 µm linearity range, 0.2 accuracy and 0.0854 µm resolutions. Some applications are given to show the applicability of this probe system.

X-ray interferometers are now a recognized tool for sub-nanometre precision metrology in National Standards Laboratories. Used in slightly different ways, they have potential for wider application as the demands for greater precision in industrial metrology increase. After reviewing some of the key ideas about using monolithic devices in this manner, it is shown that a ‘portable’ system intended for industrial standards rooms can perform well. There is a brief discussion of some issues such as vibration isolation. Details are given of a novel experimental verification that a separated-blade interferometer could operate on a state-of-the-art kinematic slideway, although for reasons of cost, a full implementation has not been attempted. An interferometer to measure angular displacements to nanoradian precisions is demonstrated. Finally, there are a few comments on where the technology is likely to develop.

In this paper there are presented the results of studies of lapping. One of the main disadvantages of lapping is the contamination of machined surfaces with micrograins of the grinding material. This phenomenon is detrimental from the tribological point of view. The micrograins which are embedded into the machined surface during coarse lapping, penetrate during the fine lapping into the abrasive slurry and interfere with the reduction of surface roughness. The abrasion wear of sliding elements is considerably increased during the operation of contaminated parts.

The high dose standard and dissemination system of g-rays has already established at NIM. Fricke dosimetry is accepted as primary standard. The transfer standards include alanine/ESR dosimetry and dichromate solution dosimetry. Those dosimeters possess many favorable characteristics, such as good linearity, long shelflife, reproducible and stable radiation response and equivalence to water in terms of radiation absorption properties.
In order to guaranteeing the product quality of radiation processing and promoting the progress of radiation techniques. On April 18, 1990, SBTS and SCST had jointly issued “the Provisional Regulation of Metrological Supervision and Management for Radiation processing”. This regulation stipulates that all the enterprises and institutions dealing with radiation processing should apply for “the Measurement License for Radiation Processing” from the local metrological administrative department of provincial government.

Humidity in compressed air is one of the most important problems in industrial and non industrial processes. The compressed air contains humidity despite of the drying process realized by the refrigeration dryer. The reason for that are located in the uncompleted separation process or in leaks along the compressed air pipes. For reasons of the energy and quality management a multiplicity of measurement principles has been developed for this application. But these technical and economical demands require more and more humidity measurement sensors with higher accuracy and long term stability. The best solution would be a direct and absolute humidity measurement system. It can be stated generally that the dew point principle is a (absolute measurement of humidity) favourable solution for such problems due to the measurement at the equilibrium state of condensation and evaporation. The developed monolithic integrated CCC*-dew point sensor bases on this thermodynamic principle and utilizes as a typical microsystem the cost advantages of the batch processes. This paper describes the most innovative CCC*- dew point sensor which is specified for the measurement of the pressure dew point temperature.