Skip to main content

Proceedings

9762 papers found

E.Balestrieri, M.Catelani, L.Ciani, S.Rapuano, A.Zanobini

A NEW STATISTICAL APPROACH TO WORD ERROR RATE MEASUREMENT IN ANALOG-TO-DIGITAL CONVERTERS

The paper is focused on the Word Error Rate (WER) estimation in Analog to Digital Converters (ADCs) as specified in Annex A of the IEEE Std. 1241. The aim is to give a contribution for the next version of such standard. A new statistical approach for WER estimation, that can better integrate what it is stated in the standard, is proposed. In particular, Student’s t and chi-square distributions have been introduced for a more accurate WER measurement in the case of n successive observations. The proposed method has been experimentally verified by means of WER measurement, where the testing...

"Instrumentation for the Information and Communication Technology Era" · TC4 · 2010 · Download
Niclas Björsell, Peter Händel, Magnus Jansson, Samer Medawar

IMPROVED ESTIMATE OF PARAMETRIC MODELS FOR ANALOGUE TO DIGITAL CONVERTERS BY USING WEIGHTED INTEGRAL NONLINEARITY DATA

Error modelling has played a major role in generating post-corrections of analogue to digital converters (ADC). Benefits by using parametric models for post-correction are that they requires less memory and that they are easier to identify for arbitrary signals. However, the parameters are estimated in two steps; firstly, the integral nonlinearity (INL) is estimated and secondly, the model parameters. In this paper we propose a method to improve the performance in the second step, by utilizing information about the statistical properties of the first step.

"Instrumentation for the Information and Communication Technology Era" · TC4 · 2010 · Download
Umberto Pogliano, Bruno Trinchera

WIDEBAND TWO-PHASE GENERATOR FOR TESTING MULTIPLE ADCS IN MEASUREMENT SYSTEMS

A two-phase generator board has been investigated as a mean to perform precision tests on the ADCs of measurement system for wideband distorted power measurement. To overcome the limitation of the commercial generator in the lower frequency band, a design modification has been introduced. Verification of the characteristics of the generator shows the possibility of operation for in the low frequency range and the a phase shift is contained within 10 mrad up to 2 MHz. A characterization in terms of spectral purity and voltage stability of single tone synthesized are reported.

"Instrumentation for the Information and Communication Technology Era" · TC4 · 2010 · Download
Samer Medawar, Peter Händel, Niclas Björsell, Magnus Jansson

PIPELINED ANALOG-DIGITAL CONVERTERS INTEGRAL NONLINEARITY MODELING FOR POST-CORRECTION

An input-dependent integral nonlinearity (INL) model is developed for pipeline ADC post-correction. The INL model consists of a static and dynamic part. The INL model is subtracted from the ADC digital output for compensation. Static compensation is performed by adjacent sets of gains and offsets. Each set compensates a certain output code range. The frequency content of the INL dynamic component is used to design a set of filter blocks that performs ADC compensation in the time domain. The compensation scheme is applied to measured data of two 12-bit ADCs of the same type (Analog Devices...

"Instrumentation for the Information and Communication Technology Era" · TC4 · 2010 · Download
F. Attivissimo, G. Cannazza, A. Cataldo, L. Fabbiano, N. Giaquinto

ANALYSIS OF THE VARIABILITY OF SYSTEMATIC ERRORS IN ADC-BASED INSTRUMENTS

The paper deals with the problem of assessing the uncertainty due to systematic errors, especially in ADC or ADC-based instruments. The problem of defining and assessing systematic errors is briefly discussed, and the conceptual scheme of gage repeatability & reproducibility is adopted. Experiments are conducted in various conditions, and it is shown that modeling the variability of systematic errors is more problematic than suggested in the ISO 5725 norm. The solution to the problem of assessing the overall uncertainty is outlined through an in-depth analysis of all the separate causes of...

"Instrumentation for the Information and Communication Technology Era" · TC4 · 2010 · Download
Miroslav Kamenský, Karol Kováč

CORRECTION OF ADC ERRORS BY ITERATIVE METHOD WITH DITHERING USING DITHER WITH UNIFORM DISTRIBUTION

For automatic correction of measurement transducer error additive iterative method (AIM) could be used. But quantization error represents limitation for correction process in application for analog-to-digital converter. Combination of AIM with nonsubtractive dithering (ND) is proposed for this kind of application and the principle of combination of both techniques is described in the paper. AIM is based on precise inverse element (IE) which in our case consists of pulse width modulation output and low-pass filter. Technique similar to deterministic dithering is employed to achieve precise...

"Instrumentation for the Information and Communication Technology Era" · TC4 · 2010 · Download
S. Y. Yurish, N. V. Kirianaki, N. O. Shpak

REFERENCE’S ACCURACY IN VIRTUAL FREQUENCY-TO-CODE CONVERTERS

The methodology and experimental results of the researches for thermal instability of reference clock generator in microcontroller based frequency-to-code converters with virtual channel are described in the Paper. The temperature uncertainty of the frequency and time references, distribution laws and correlation factor of their errors were determined in the experiments. The maximum relative temperature error of the frequency reference is ± 11.5 &middot 10 -6 , and the maximum temperature error of the time reference is ± 0.38 &middot 10 -6 . The total relative error of the “measurement...

XVI IMEKO World Congress · 2000 · Download
Carsten Wegener, Michael Peter Kennedy

TESTING INL OR DNL - IS THERE A TRADE-OFF?

Traditionally, production testing of data converters is based on measuring either the Integral or the Differential Nonlinearity (INL or DNL), respectively and computing the other. Doubts about this practice are raised as examples show that some error mechanisms in a given circuit have a characteristic INL-signature while others have a distinctive DNL-signature. In this work we address the question “should one measure INL or DNL.” We extend the Linear Error Mechanism Modeling Algorithm to use both INL and DNL measurements simultaneously (if so required) to measure a device under test (DUT)...

XVI IMEKO World Congress · 2000 · Download
I. Vecera, R. Vrba

ALGORITHMIC SWITCHED-CURRENT AD CONVERTER WITH BUILT- IN SELF TEST FOR PRESSURE SMART SENSOR

The paper deals with the research and analysis of up-to-date system approach to SI AD conversion focused to pressure smart sensors for system integration. Built-in self-testing improves quality and reliability of analogue to digital conversion. This trend is encouraged by industrial implementation of pressure smart sensors including AD converter into sensor/actuator fieldbus driven systems.

XVI IMEKO World Congress · 2000 · Download