Ho Sun Shin,Joon Sung Lee,Seong Gi Jeon,Jin Yu, Jae Yong Song
We have fabricated a MEMS device on suspended silicon nitride in order to measure the thermoelectric properties of single nanowire. The temperature gradient was generated by a nanoheater and the temperatures of thermometers were calibrated and measured. Seebeck coefficient and electrical conductivity of single Bi2Te3 nanowire with a 70 nm-diameter were measured in the temperature range of 50 K to 400 K. Based on the simulation results of the temperature distribution over the MEMS structure, the method of calibrating the temperature and measurement uncertainty are discussed.
XX IMEKO World Congress
· 2012
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S. Gao, M. Lu, W. Li, Y. Shi, X. Tao
A metrological atomic force microscope (AFM) with 50 mm × 50 mm × 2 mm scan range has been designed and constructed. In this paper, the structure and preliminary results are introduced. The precise movement of the sample is driven by a piezoelectric motion stage and air-bearing stage for different scanning range. Four multi-pass homodyne interferometers attached to the metrological frame measure the relative displacement between the probe and sample. A novel AFM head is used to detect the topography at contact mode. Step height standard is measured and the results show that the system is...
XX IMEKO World Congress
· 2012
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Wondong Kim, Sangsun Lee, Chanyong Hwang
We developed scanning electron microscopy with polarization analysis (SEMPA) system and utilized it to characterize the local magnetic probes used in the magnetic microscopy based on the scanning probe method. With a specially designed reference sample we could determine the Sherman function of spin detector and the uncertainty in measurement of spin polarization. Based on the measurement procedure established with the reference sample, we could characterize the local magnetic probes by measuring the magnetic domain images and the spin polarization of the magnetic probes.
XX IMEKO World Congress
· 2012
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I. Malinovsky, R. S. Franca, I. B. Couceiro, M. S. Lima, C. L. S. Azeredo, C. M. S. Almeida, J. P. Weid
Here we report development of the primary nanometrology capacity at National Metrology Institute of Brazil (INMETRO). The interference microscope (IM) of Linnik type has been developed and it is currently under optimization and characterization. The registration of the fringes is done by automated CCD system with 2 possible processing approaches: interferometric pattern processing and the phase stepping technique. Some progress in development of the hardware and software adequate for subnanometer resolution of the instrument is reported. Some study of systematical errors of IM has been...
XX IMEKO World Congress
· 2012
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Hyun Mo Cho, Won Chegal, Yong Jai Cho, Jong Myoung Won, Moonseob Jin, Daesuk Kim
We report on a high-sensitivity surface plasmon resonance (SPR) sensor based on phase measurements using rotating analyzer ellipsometry. In this work, the experimental setup for the SPR sensor was based on a custom-built rotating analyzer ellipsometer, which was equipped with a SPR cell and a microfluidic system. The most important feature of our system is that biomolecular detection sensitivity can be significantly enhanced by measuring the phase difference between the s- and ppolarizations. In this paper, we demonstrate how a custombuilt rotating analyzer ellipsometer in the SPR condition...
XX IMEKO World Congress
· 2012
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Muzheng Xiao, Tomohiko Takamura, Satoru Takahashi, Kiyoshi Takamasu
Deflectometry methods are widely used for flatness measurement of optical surfaces with sub-nanometre uncertainty. In the other hand, the limitation of measuring range of the autocollimator makes it unavailable for surfaces with large angle change. In this paper, a new method is proposed to enlarge the measuring range of the autocollimator so that surfaces with large slope change are measurable. The data processing methods are introduced and experimental setup is built. A concave mirror with large slope change is measured to verify the basic principle of proposed method. The experiment...
XX IMEKO World Congress
· 2012
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C. Yin, J. Qian, J. Wang, C. Shi
Atom lithography can be used to fabricate regular nanoscale pattern on a substrate with high resolution and large area. Because the pitch of the grating is traceable to absolute atomic frequency, it has potential to be used as nanoscale pitch standards. The researches on laser focusing chromium in national institute of metrology are reported in this paper. Chromium wire array with a pitch of λ/2 and a height of 1 nm has been deposited on InP substrate.
XX IMEKO World Congress
· 2012
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B. -J. Park, D. Khishigmaa, N. W. Song
This study is aimed to determine proper measurement parameters and procedures for accurate DLS measurement in determining the size of nanoparticles in a solution. We evaluated the effect of dust limit, upper dust limit and accumulation number on the relative repeatability uncertainty of DLS size measurement. Our proposed protocol reduced the relative repeatability uncertainty of size measurement down to 5% for suspension of gold nanoparticle (AuNP).
XX IMEKO World Congress
· 2012
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C.Divieto, G.Sassi, M.P.Sassi
Cell counting is an important procedure in cell biology and its uncertainty evaluation is fundamental to improve cell-based measurement comparability which is currently variable. In this study, for the first time, the uncertainty of a metabolic assay for cell counting based on fluorescence intensity measurement has been evaluated. Results, in 2D cell culture, revealed that three are the main components: repeatability and reproducibility of the measurement system and a contribution due to the sample loading step procedure. This study represents the basis of a 3D cell culture in which...
XX IMEKO World Congress
· 2012
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B. Cho, Y. Cho, S. Ahn, H. Lee, B. Park, C. Hwang
The spatial coherence length of electron beam was measured by using multi-walled carbon nanotubes as an element of a nano-biprism. With decreasing the source temperature from 300 K to 78 K, the visibility of the interference fringe of emitted electrons increases by a factor of 3, and the band of the interference pattern widens by a factor of 5.
XX IMEKO World Congress
· 2012
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